Direct imprint in metal film stacks with low pressure and low temperature for optical elements applications

H. C. Cheng*, S. Y. Chuang, H. L. Chen, Y. L. Hung, Fu-Hsiang Ko

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

The improvements being done to the direct imprint process using a sharp mold and inserting a soft pad, which is the diluted resist between the gold film and the substrate were discussed. A silicon mold was fabricated using electron beam lithography followed by the anisotropic reactive ion etching (RIE) process. It was observed that the temperature of the direct imprint process must be maintained below the glass transition temperature of the bottom soft pad to avoid pattern distortion. To understand the influence of temperature in the direct imprint process, the film stacks were imprinted with different temperatures using a mold profile controlling.

Original languageEnglish
Title of host publicationDigest of Papers - Microprocesses and Nanotechnology 2004
Pages138-139
Number of pages2
DOIs
StatePublished - 1 Dec 2004
Event2004 International Microprocesses and Nanotechnology Conference - Osaka, Japan
Duration: 26 Oct 200429 Oct 2004

Publication series

NameDigest of Papers - Microprocesses and Nanotechnology 2004

Conference

Conference2004 International Microprocesses and Nanotechnology Conference
Country/TerritoryJapan
CityOsaka
Period26/10/0429/10/04

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