Direct experimental evidence of the hole capture by resonant levels in boron doped silicon

Shun-Tung Yen*, V. Tulupenko, E. S. Cheng, A. Dalakyan, C. P. Lee, K. A. Chao, V. Belykh, A. Abramov, V. Ryzhkov

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

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Physics & Astronomy