Dimensional effects on the reliability of polycrystalline silicon thin-film transistors

Hsiao-Wen Zan*, P. S. Shih, T. C. Chang, C. Y. Chang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations
Original languageEnglish
Pages (from-to)1479-1483
Number of pages5
JournalMicroelectronics Reliability
Issue number8-10
StatePublished - 1 Jan 2000

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