Determination of contact and intrinsic nanowire resistivity in two-contact ZnO nanowire devices
- Y. F. Lin
- , Wen-Bin Jian*
- , Z. Y. Wu
- , F. R. Chen
- , J. J. Kai
- , Juhn-Jong Lin
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review