Determination of contact and intrinsic nanowire resistivity in two-contact ZnO nanowire devices

Y. F. Lin, Wen-Bin Jian*, Z. Y. Wu, F. R. Chen, J. J. Kai, Juhn-Jong Lin

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Fingerprint

Dive into the research topics of 'Determination of contact and intrinsic nanowire resistivity in two-contact ZnO nanowire devices'. Together they form a unique fingerprint.

Engineering & Materials Science