Detecting solid-state disk geometry for write pattern optimization

Chun Chieh Kuo*, Jen Wei Hsieh, Li-Pin Chang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Solid-state disks use flash memory as their storage medium, and adopt a firmware layer that makes data mapping and wear leveling transparent to the hosts. Even though solid-state disks emulate a collection of logical sectors, the I/O delays of accessing all these logical sectors are not uniform because the management of flash memory is subject to many physical constraints of flash memory. This work proposes a collection of black-box tests can detect the geometry inside of a solid-state disk. The host system software can arrange data in the logical disk space according to the detected geometry information to match the host write pattern with the device characteristic for reducing the flash management overhead in solid-state disks.

Original languageEnglish
Title of host publicationProceedings - 1st International Workshop on Cyber-Physical Systems, Networks, and Applications, CPSNA 2011, Workshop Held During RTCSA 2011
Pages89-94
Number of pages6
DOIs
StatePublished - 1 Dec 2011
Event1st International Workshop on Cyber-Physical Systems, Networks, and Applications, CPSNA 2011, Co-located with the 17th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications, RTCSA 2011 - Toyama, Japan
Duration: 28 Aug 201131 Aug 2011

Publication series

NameProceedings - 1st International Workshop on Cyber-Physical Systems, Networks, and Applications, CPSNA 2011, Workshop Held During RTCSA 2011
Volume2

Conference

Conference1st International Workshop on Cyber-Physical Systems, Networks, and Applications, CPSNA 2011, Co-located with the 17th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications, RTCSA 2011
Country/TerritoryJapan
CityToyama
Period28/08/1131/08/11

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