Design of on-chip power-rail ESD clamp circuit with ultra-small capacitance to detect ESD transition

Shih Hung Chen; Ming-Dou Ker

doi:10.1109/VDAT.2009.5158161

Design of on-chip power-rail ESD clamp circuit with ultra-small capacitance to detect ESD transition

Shih Hung Chen^*, Ming-Dou Ker

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Scopus citations

Abstract

A power-rail ESD clamp circuit with a new proposed ESD-transient detection circuit which adopts a ultra small capacitor to achieve the required functions has been presented and substantiated to own a long turn-on duration and high turn-on efficiency. In addition, the power-rail ESD clamp circuits with the new proposed ESD-transient detection circuit also presented an excellent immunity against the mis-trigger and the latch-on event under the fast power-on condition.

Original language	English
Title of host publication	2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09
Pages	327-330
Number of pages	4
DOIs	https://doi.org/10.1109/VDAT.2009.5158161
State	Published - 1 Dec 2009
Event	2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09 - Hsinchu, Taiwan Duration: 28 Apr 2009 → 30 Apr 2009

Publication series

Name	2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09

Conference

Conference	2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09
Country/Territory	Taiwan
City	Hsinchu
Period	28/04/09 → 30/04/09

Access to Document

10.1109/VDAT.2009.5158161

Cite this

@inproceedings{4336781a7b07415784bc27d5aa3a7ede,

title = "Design of on-chip power-rail ESD clamp circuit with ultra-small capacitance to detect ESD transition",

abstract = "A power-rail ESD clamp circuit with a new proposed ESD-transient detection circuit which adopts a ultra small capacitor to achieve the required functions has been presented and substantiated to own a long turn-on duration and high turn-on efficiency. In addition, the power-rail ESD clamp circuits with the new proposed ESD-transient detection circuit also presented an excellent immunity against the mis-trigger and the latch-on event under the fast power-on condition.",

author = "Chen, {Shih Hung} and Ming-Dou Ker",

year = "2009",

month = dec,

day = "1",

doi = "10.1109/VDAT.2009.5158161",

language = "English",

isbn = "9781424427826",

series = "2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09",

pages = "327--330",

booktitle = "2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09",

note = "2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09 ; Conference date: 28-04-2009 Through 30-04-2009",

}

Chen, SH & Ker, M-D 2009, Design of on-chip power-rail ESD clamp circuit with ultra-small capacitance to detect ESD transition. in 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09., 5158161, 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09, pp. 327-330, 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09, Hsinchu, Taiwan, 28/04/09. https://doi.org/10.1109/VDAT.2009.5158161

Design of on-chip power-rail ESD clamp circuit with ultra-small capacitance to detect ESD transition. / Chen, Shih Hung; Ker, Ming-Dou.
2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09. 2009. p. 327-330 5158161 (2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Design of on-chip power-rail ESD clamp circuit with ultra-small capacitance to detect ESD transition

AU - Chen, Shih Hung

AU - Ker, Ming-Dou

PY - 2009/12/1

Y1 - 2009/12/1

N2 - A power-rail ESD clamp circuit with a new proposed ESD-transient detection circuit which adopts a ultra small capacitor to achieve the required functions has been presented and substantiated to own a long turn-on duration and high turn-on efficiency. In addition, the power-rail ESD clamp circuits with the new proposed ESD-transient detection circuit also presented an excellent immunity against the mis-trigger and the latch-on event under the fast power-on condition.

AB - A power-rail ESD clamp circuit with a new proposed ESD-transient detection circuit which adopts a ultra small capacitor to achieve the required functions has been presented and substantiated to own a long turn-on duration and high turn-on efficiency. In addition, the power-rail ESD clamp circuits with the new proposed ESD-transient detection circuit also presented an excellent immunity against the mis-trigger and the latch-on event under the fast power-on condition.

UR - http://www.scopus.com/inward/record.url?scp=77950670378&partnerID=8YFLogxK

U2 - 10.1109/VDAT.2009.5158161

DO - 10.1109/VDAT.2009.5158161

M3 - Conference contribution

AN - SCOPUS:77950670378

SN - 9781424427826

T3 - 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09

SP - 327

EP - 330

BT - 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09

T2 - 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09

Y2 - 28 April 2009 through 30 April 2009

ER -

Design of on-chip power-rail ESD clamp circuit with ultra-small capacitance to detect ESD transition

Abstract

Publication series

Conference

Access to Document

Other files and links

Fingerprint

Cite this