Abstract
A planar CMOS Si/SiGe heterostructure is proposed. Simulation results show that Si/SiGe CMOSFETs exhibit enhanced drive current and device speed over bulk Si devices without sacrificing electrostatic integrity. This indicates that Si/SiGe CMOSFETs have a great potential to replace Si MOSFETs in application-specific designs.
| Original language | English |
|---|---|
| Pages (from-to) | 1030-1033 |
| Number of pages | 4 |
| Journal | Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films |
| Volume | 20 |
| Issue number | 3 |
| DOIs | |
| State | Published - May 2002 |