TY - GEN
T1 - Design and implementation of capacitive sensor readout circuit on glass substrate for touch panel applications
AU - Wang, Tzu Ming
AU - Ker, Ming-Dou
PY - 2011/6/28
Y1 - 2011/6/28
N2 - A capacitive sensor readout circuit on glass substrate for touch panel applications has been designed and fabricated in a 3-μm low temperature poly-silicon (LTPS) technology. In this work, the small voltage difference from capacitance change due to the touch event on panel is amplified by the switch-capacitor (SC) technique. In order to reduce the effect from device characteristic variation in LTPS process, the proposed readout circuit applies the corrected double-sampling (CDS) technique to reduce the offset originated from LTPS process variation. To enhance the resolution of touch panel, a 4-bit analog-to-digital converter is utilized to identify the different touch area conditions.
AB - A capacitive sensor readout circuit on glass substrate for touch panel applications has been designed and fabricated in a 3-μm low temperature poly-silicon (LTPS) technology. In this work, the small voltage difference from capacitance change due to the touch event on panel is amplified by the switch-capacitor (SC) technique. In order to reduce the effect from device characteristic variation in LTPS process, the proposed readout circuit applies the corrected double-sampling (CDS) technique to reduce the offset originated from LTPS process variation. To enhance the resolution of touch panel, a 4-bit analog-to-digital converter is utilized to identify the different touch area conditions.
UR - http://www.scopus.com/inward/record.url?scp=79959511308&partnerID=8YFLogxK
U2 - 10.1109/VDAT.2011.5783627
DO - 10.1109/VDAT.2011.5783627
M3 - Conference contribution
AN - SCOPUS:79959511308
SN - 9781424484997
T3 - Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
SP - 269
EP - 272
BT - Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
T2 - 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
Y2 - 25 April 2011 through 28 April 2011
ER -