Dependences of damping frequency and damping factor of bi-polar trigger waveforms on transient-induced latchup

Sheng Fu Hsu; Ming-Dou Ker

Dependences of damping frequency and damping factor of bi-polar trigger waveforms on transient-induced latchup

Sheng Fu Hsu^*, Ming-Dou Ker

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

The dependences of damping frequency and damping factor of bi-polar trigger waveforms on transient-induced latchup (TLU) were characterized by device simulation and verified by experimental measurement. From the simulation results, the bi-polar trigger waveform with damping frequency of several tens of megahertz can trigger on TLU most easily. But, TLU is less sensitive to bi-polar trigger waveforms with an excessively large damping factor, an excessively high damping frequency, or an excessively low damping frequency. The simulation results have been experimentally verified with the silicon controlled rectifier (SCR) test structures fabricated in a 0.25-μm CMOS technology. Copyright 2005

Original language	English
Title of host publication	2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005
State	Published - Sep 2005
Event	2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005 - Anaheim, CA, United States Duration: 8 Sep 2005 → 16 Sep 2005

Publication series

Name	Electrical Overstress/Electrostatic Discharge Symposium Proceedings
ISSN (Print)	0739-5159

Conference

Conference	2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005
Country/Territory	United States
City	Anaheim, CA
Period	8/09/05 → 16/09/05

Cite this

@inproceedings{4420a76a5e724446b014f821b0190022,

title = "Dependences of damping frequency and damping factor of bi-polar trigger waveforms on transient-induced latchup",

abstract = "The dependences of damping frequency and damping factor of bi-polar trigger waveforms on transient-induced latchup (TLU) were characterized by device simulation and verified by experimental measurement. From the simulation results, the bi-polar trigger waveform with damping frequency of several tens of megahertz can trigger on TLU most easily. But, TLU is less sensitive to bi-polar trigger waveforms with an excessively large damping factor, an excessively high damping frequency, or an excessively low damping frequency. The simulation results have been experimentally verified with the silicon controlled rectifier (SCR) test structures fabricated in a 0.25-μm CMOS technology. Copyright 2005",

author = "Hsu, {Sheng Fu} and Ming-Dou Ker",

year = "2005",

month = sep,

language = "English",

isbn = "158537069X",

series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",

booktitle = "2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005",

note = "2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005 ; Conference date: 08-09-2005 Through 16-09-2005",

}

Hsu, SF & Ker, M-D 2005, Dependences of damping frequency and damping factor of bi-polar trigger waveforms on transient-induced latchup. in 2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005., 5271811, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005, Anaheim, CA, United States, 8/09/05.

Dependences of damping frequency and damping factor of bi-polar trigger waveforms on transient-induced latchup. / Hsu, Sheng Fu; Ker, Ming-Dou.
2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005. 2005. 5271811 (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Dependences of damping frequency and damping factor of bi-polar trigger waveforms on transient-induced latchup

AU - Hsu, Sheng Fu

AU - Ker, Ming-Dou

PY - 2005/9

Y1 - 2005/9

N2 - The dependences of damping frequency and damping factor of bi-polar trigger waveforms on transient-induced latchup (TLU) were characterized by device simulation and verified by experimental measurement. From the simulation results, the bi-polar trigger waveform with damping frequency of several tens of megahertz can trigger on TLU most easily. But, TLU is less sensitive to bi-polar trigger waveforms with an excessively large damping factor, an excessively high damping frequency, or an excessively low damping frequency. The simulation results have been experimentally verified with the silicon controlled rectifier (SCR) test structures fabricated in a 0.25-μm CMOS technology. Copyright 2005

AB - The dependences of damping frequency and damping factor of bi-polar trigger waveforms on transient-induced latchup (TLU) were characterized by device simulation and verified by experimental measurement. From the simulation results, the bi-polar trigger waveform with damping frequency of several tens of megahertz can trigger on TLU most easily. But, TLU is less sensitive to bi-polar trigger waveforms with an excessively large damping factor, an excessively high damping frequency, or an excessively low damping frequency. The simulation results have been experimentally verified with the silicon controlled rectifier (SCR) test structures fabricated in a 0.25-μm CMOS technology. Copyright 2005

UR - http://www.scopus.com/inward/record.url?scp=70449706114&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:70449706114

SN - 158537069X

SN - 9781585370696

T3 - Electrical Overstress/Electrostatic Discharge Symposium Proceedings

BT - 2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005

T2 - 2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005

Y2 - 8 September 2005 through 16 September 2005

ER -

Dependences of damping frequency and damping factor of bi-polar trigger waveforms on transient-induced latchup

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