DEPENDENCE OF THE UPPER CRITICAL FIELD AND CRITICAL CURRENT ON RESISTIVITY IN NbN THIN FILMS.

Jenh-Yih Juang*, D. A. Rudman, R. B. van Dover, W. R. Sinclair, D. D. Bacon

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

9 Scopus citations

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Engineering & Materials Science