DEPENDENCE OF THE UPPER CRITICAL FIELD AND CRITICAL CURRENT ON RESISTIVITY IN NbN THIN FILMS.
- Jenh-Yih Juang*
- , D. A. Rudman
- , R. B. van Dover
- , W. R. Sinclair
- , D. D. Bacon
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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