Degradation mechanisms of bias stress on nitride-based near-ultraviolet light-emitting diodes in salt water vapor ambient

Lih Ren Chen, Shen Che Huang, Jo Lun Chiu, Chien Cheng Lu, Wei Ming Su, Chen Yuan Weng, Huan Yu Shen, Tien Chang Lu*, Hsiang Chen

*Corresponding author for this work

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