Defect Detection on Metal Laptop Cases by Up-sampling and Down-sampling Method

Hsien I. Lin*, Satrio Dwi Sanjaya, Landge Rupa

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Keyphrases

Computer Science

Engineering

Chemical Engineering

Earth and Planetary Sciences

Immunology and Microbiology