Fingerprint
Dive into the research topics of 'DC-free Method to Evaluate Nanoscale Equivalent Oxide Thickness: Dark-Mode Scanning Capacitance Microscopy'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
DC-free Method to Evaluate Nanoscale Equivalent Oxide Thickness: Dark-Mode Scanning Capacitance Microscopy
Mao Nan Chang*, Yi Shan Wu, Chiao Jung Lin, Yu Hsun Hsueh, Chun Jung Su, Yao Jen Lee
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review