Crosstalk effect removal for analog measurement in analog test bus

Chau-Chin Su; Yue Tsang Chen

doi:10.1109/VTEST.2000.843871

Crosstalk effect removal for analog measurement in analog test bus

Chau-Chin Su^*, Yue Tsang Chen

^*Corresponding author for this work

Department of Electrical and Computer Engineering

Research output: Contribution to conference › Paper › peer-review

3 Scopus citations

Abstract

A DSP based test methodology is proposed to remove the parasitic and crosstalk effects, the two major drawbacks when using the analog buses. Experiments, using SPICE simulation and real measurement data show a significant improvement over the direct measurement.

Original language	English
Pages	403-408
Number of pages	6
DOIs	https://doi.org/10.1109/VTEST.2000.843871
State	Published - 1 Jan 2000
Event	18th IEEE VLSI Test Symposium (VTS-2000) - Montreal, Que, Can Duration: 30 Apr 2000 → 4 May 2000

Conference

Conference	18th IEEE VLSI Test Symposium (VTS-2000)
City	Montreal, Que, Can
Period	30/04/00 → 4/05/00

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10.1109/VTEST.2000.843871

Cite this

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title = "Crosstalk effect removal for analog measurement in analog test bus",

abstract = "A DSP based test methodology is proposed to remove the parasitic and crosstalk effects, the two major drawbacks when using the analog buses. Experiments, using SPICE simulation and real measurement data show a significant improvement over the direct measurement.",

author = "Chau-Chin Su and Chen, {Yue Tsang}",

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doi = "10.1109/VTEST.2000.843871",

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T2 - 18th IEEE VLSI Test Symposium (VTS-2000)

Y2 - 30 April 2000 through 4 May 2000

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Crosstalk effect removal for analog measurement in analog test bus

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Conference

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