Cost-Efficient Solution to Overcome Latch-Up Path in 5 V-Tolerant I/O With Low-Voltage Biased NBL Isolation Ring in a 0.18-<inline-formula> <tex-math notation="LaTeX">$\mu $</tex-math> </inline-formula>m BCD Technology

Chen Wei Hsu, Ming Dou Ker

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

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Medicine and Dentistry