Abstract
In recent years, promoting the sensing accuracy of the image pixel sensor has become a hot issue. For voltage type active pixel sensor (V-APS), the readout voltage, as well as the sensing signal, will be affected by the thin film transistors (TFTs) characteristic variation, especially the shift in threshold voltage (Vth). In this paper, we introduce a novel correlated double sampling (CDS) circuit, which can be implemented on glass by only using TFTs and capacitors. Thus, the readout voltage variation due to the threshold voltage shift under same light intensity illumination can be eliminated.
Original language | English |
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Pages (from-to) | 1340-1343 |
Number of pages | 4 |
Journal | Digest of Technical Papers - SID International Symposium |
Volume | 52 |
Issue number | 1 |
DOIs | |
State | Published - Jun 2021 |
Event | 58th International Symposium on Digest of Technical Papers, ICDT 2021 - Virtual, Online Duration: 17 May 2021 → 21 May 2021 |
Keywords
- Active pixel sensor
- Correlated double sampling
- Dynamic range
- TFT
- Threshold voltage variation