Construction of a near-field spectrum analysis system using bent tapered fiber probes

Sy Hann Chen; Yung-Fu Chen

doi:10.1063/1.1327302

Construction of a near-field spectrum analysis system using bent tapered fiber probes

Sy Hann Chen^*, Yung-Fu Chen

^*Corresponding author for this work

Department of Electrophysics

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

We take advantage of a combination of laser heating and pulling and electric arc bending to fabricate bent tapered fiber probes. The bent angles can be varied from 30° to 70° and tip diameters fall within a few tens of nanometers. These bent fiber probes can easily be adapted into any dynamic mode atomic force microscope. By proper manipulation of the bent angles, a spatial resolution of up to 60 nm is achievable. After coating the bent fiber probes with a thin layer of Pt/Pd film by ion sputtering, the transmission efficiency is measured to be around 10^-5, which is applicable for near-field spectrum analysis experiment.

Original language	English
Pages (from-to)	268-270
Number of pages	3
Journal	Review of Scientific Instruments
Volume	72
Issue number	1 I
DOIs	https://doi.org/10.1063/1.1327302
State	Published - Jan 2001

Access to Document

10.1063/1.1327302

Cite this

@article{564610d6d4954a33bcbdc682d1cc8d40,

title = "Construction of a near-field spectrum analysis system using bent tapered fiber probes",

abstract = "We take advantage of a combination of laser heating and pulling and electric arc bending to fabricate bent tapered fiber probes. The bent angles can be varied from 30° to 70° and tip diameters fall within a few tens of nanometers. These bent fiber probes can easily be adapted into any dynamic mode atomic force microscope. By proper manipulation of the bent angles, a spatial resolution of up to 60 nm is achievable. After coating the bent fiber probes with a thin layer of Pt/Pd film by ion sputtering, the transmission efficiency is measured to be around 10-5, which is applicable for near-field spectrum analysis experiment.",

author = "Chen, {Sy Hann} and Yung-Fu Chen",

year = "2001",

month = jan,

doi = "10.1063/1.1327302",

language = "English",

volume = "72",

pages = "268--270",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics",

number = "1 I",

}

TY - JOUR

T1 - Construction of a near-field spectrum analysis system using bent tapered fiber probes

AU - Chen, Sy Hann

AU - Chen, Yung-Fu

PY - 2001/1

Y1 - 2001/1

N2 - We take advantage of a combination of laser heating and pulling and electric arc bending to fabricate bent tapered fiber probes. The bent angles can be varied from 30° to 70° and tip diameters fall within a few tens of nanometers. These bent fiber probes can easily be adapted into any dynamic mode atomic force microscope. By proper manipulation of the bent angles, a spatial resolution of up to 60 nm is achievable. After coating the bent fiber probes with a thin layer of Pt/Pd film by ion sputtering, the transmission efficiency is measured to be around 10-5, which is applicable for near-field spectrum analysis experiment.

AB - We take advantage of a combination of laser heating and pulling and electric arc bending to fabricate bent tapered fiber probes. The bent angles can be varied from 30° to 70° and tip diameters fall within a few tens of nanometers. These bent fiber probes can easily be adapted into any dynamic mode atomic force microscope. By proper manipulation of the bent angles, a spatial resolution of up to 60 nm is achievable. After coating the bent fiber probes with a thin layer of Pt/Pd film by ion sputtering, the transmission efficiency is measured to be around 10-5, which is applicable for near-field spectrum analysis experiment.

UR - http://www.scopus.com/inward/record.url?scp=5844283507&partnerID=8YFLogxK

U2 - 10.1063/1.1327302

DO - 10.1063/1.1327302

M3 - Article

AN - SCOPUS:5844283507

SN - 0034-6748

VL - 72

SP - 268

EP - 270

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 1 I

ER -

Construction of a near-field spectrum analysis system using bent tapered fiber probes

Abstract

Access to Document

Other files and links

Fingerprint

Cite this