Skip to main navigation Skip to search Skip to main content

Comprehensive Investigations of HBM ESD Robustness for GaN-on-Si RF HEMTs

  • S. Abhinay*
  • , W. M. Wu
  • , C. A. Shih
  • , S. H. Chen
  • , A. Sibaja-Hernandez
  • , B. Parvais
  • , U. Peralagu
  • , A. Alian
  • , T. L. Wu
  • , M. D. Ker
  • , G. Groeseneken
  • , N. Collaert
    • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Scopus citations

Fingerprint

Dive into the research topics of 'Comprehensive Investigations of HBM ESD Robustness for GaN-on-Si RF HEMTs'. Together they form a unique fingerprint.
Sort by

Keyphrases

Material Science