Comprehensive examination of threshold voltage fluctuations in nanoscale planar MOSFET and bulk FinFET devices

Chih Hong Hwang*, Hui Wen Cheng, Ta Ching Yeh, Tien Yeh Li, Hsuan Ming Huang, Yi-Ming Li

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Engineering

Material Science