Keyphrases
AC Characteristics
50%
AC-DC
50%
Atomistic Simulation
50%
Characteristic Fluctuation
100%
Complementary Metal Oxide Semiconductor
100%
Complementary Metal Oxide Semiconductor Field Effect Transistor
50%
Comprehensive Examination
100%
Cut-off Frequency
50%
DC Characteristics
50%
Device Characteristics
50%
Device Yield
50%
Gate Bias
50%
Gate Capacitance
50%
Intrinsic Fluctuations
50%
Intrinsic Parameters
100%
Metal Gate
50%
Metal-oxide-semiconductor Devices
100%
MOSFET
50%
Nanoscale Semiconductor Devices
50%
PMOSFET
50%
Process Variation Effect
100%
Random Dopant Fluctuation
100%
Threshold Voltage
50%
Work Function Fluctuation
100%
Engineering
Atomistic Simulation
33%
Complementary Metal-Oxide-Semiconductor
33%
Complementary Metal-Oxide-Semiconductor Device
100%
Cutoff Frequency
33%
Dopants
66%
Gate Bias
33%
Gate Capacitance
33%
Intrinsic Parameter
100%
Metal Gate
33%
Metal-Oxide-Semiconductor Field-Effect Transistor
100%
Nanoscale
33%
Process Variation
66%
Random Fluctuation
33%
Semiconductor Device
33%
Material Science
Capacitance
33%
Complementary Metal-Oxide-Semiconductor Device
100%
Doping (Additives)
66%
Metal-Oxide-Semiconductor Field-Effect Transistor
100%
Semiconductor Device
33%