Comparison of Intrinsic Gettering and Epitaxial Wafers in Terms of Soft Error Endurance and Other Characteristics of 64k Bit Dynamic RAM

Hiroshi Iwai, Hideo Otsuka, Yasuo Matsumotc, Kiyoshi Hisatomi, Kyoji Aoki

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

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Chemical Compounds

Engineering & Materials Science