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Comparison of Experimentally Extracted Top and Edge Contact Resistivity by TLM Structure with Two-step Sulfurization Nb-Doped MoS2
Chi Feng Li, Yun Yan Chung, Chao Ting Lin, Yen Teng Ho, Chao Hsin Chien
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1
Scopus
citations