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Compact Modeling and Experimental Validation of Reverse Mode Impact Ionization in LDMOS Transistors within the BSIM-BULK Framework
Yawar Hayat Zarkob*, Ayushi Sharma, Girish Pahwa, Debashish Nandi, Chetan K. Dabhi, Volker Kubrak, Bob Peddenpohl, Mingchun Tang, Chenming Hu, Yogesh Singh Chauhan
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1
Scopus
citations