Compact and low-loss ESD protection design for V-band RF applications in a 65-nm CMOS technology

Li Wei Chu*, Chun Yu Lin, Shiang Yu Tsai, Ming-Dou Ker, Ming Hsiang Song, Chewn Pu Jou, Tse Hua Lu, Jen Chou Tseng, Ming Hsien Tsai, Tsun Lai Hsu, Ping Fang Hung, Tzu Heng Chang

*Corresponding author for this work

    Research output: Contribution to conference › Paper › peer-review

    2 Scopus citations

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    Engineering & Materials Science