Abstract
To increase the ESD robustness and to reduce the trigger voltage of the ESD protection devices, a substrate-triggering technique is proposed to effectively enhance the ESD-protection efficiency of CMOS on-chip ESD protection circuits in submicron CMOS technologies. With suitable substrate bias, the ESD protection devices can sustain much higher ESD-stress voltage within small layout area. Two practical design examples of the input ESD protection circuit and the VDD-to-VSS ESD clamp circuit are designed by using the substrate-triggering technique to verify the ESD protection efficiency.
Original language | English |
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Pages | 273-276 |
Number of pages | 4 |
DOIs | |
State | Published - 1 Dec 1998 |
Event | Proceedings of the 1998 5th IEEE International Conference on Electronics, Circuits and Systems (ICECS'98) - Surfing the Waves of Science and Technology - Lisboa, Portugal Duration: 7 Sep 1998 → 10 Sep 1998 |
Conference
Conference | Proceedings of the 1998 5th IEEE International Conference on Electronics, Circuits and Systems (ICECS'98) - Surfing the Waves of Science and Technology |
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City | Lisboa, Portugal |
Period | 7/09/98 → 10/09/98 |