Circuit design to achieve whole-chip ESD protection for UXGA/HDTV LCos IC product

Ming-Dou Ker; Shih Hung Chen; Tang Kui Tseng

doi:10.1109/APCCAS.2004.1413011

Circuit design to achieve whole-chip ESD protection for UXGA/HDTV LCos IC product

Ming-Dou Ker^*, Shih Hung Chen, Tang Kui Tseng

^*Corresponding author for this work

Research output: Contribution to conference › Paper › peer-review

Abstract

Successful circuit design to achieve the whole-chip electrostatic discharge (ESD) protection for an UXGA/HDTV LCoS IC product with a die size of 20289.6μm × 16841.5μm has been proposed and practically verified in 0.35-μm 3.3V/12V CMOS process. This LCoS IC with both of low-voltage (LV) and high-voltage (HV) ESD protection circuits can sustain ESD stresses of 3.5kV and 200V in human-body-model (HBM) and machine-model (MM) ESD test standards, respectively.

Original language	English
Pages	845-848
Number of pages	4
DOIs	https://doi.org/10.1109/APCCAS.2004.1413011
State	Published - 1 Dec 2004
Event	2004 IEEE Asia-Pacific Conference on Circuits and Systems, APCCAS 2004: SoC Design for Ubiquitous Information Technology - Tainan, Taiwan Duration: 6 Dec 2004 → 9 Dec 2004

Conference

Conference	2004 IEEE Asia-Pacific Conference on Circuits and Systems, APCCAS 2004: SoC Design for Ubiquitous Information Technology
Country/Territory	Taiwan
City	Tainan
Period	6/12/04 → 9/12/04

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10.1109/APCCAS.2004.1413011

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title = "Circuit design to achieve whole-chip ESD protection for UXGA/HDTV LCos IC product",

abstract = "Successful circuit design to achieve the whole-chip electrostatic discharge (ESD) protection for an UXGA/HDTV LCoS IC product with a die size of 20289.6μm × 16841.5μm has been proposed and practically verified in 0.35-μm 3.3V/12V CMOS process. This LCoS IC with both of low-voltage (LV) and high-voltage (HV) ESD protection circuits can sustain ESD stresses of 3.5kV and 200V in human-body-model (HBM) and machine-model (MM) ESD test standards, respectively.",

author = "Ming-Dou Ker and Chen, {Shih Hung} and Tseng, {Tang Kui}",

year = "2004",

month = dec,

day = "1",

doi = "10.1109/APCCAS.2004.1413011",

language = "English",

pages = "845--848",

note = "2004 IEEE Asia-Pacific Conference on Circuits and Systems, APCCAS 2004: SoC Design for Ubiquitous Information Technology ; Conference date: 06-12-2004 Through 09-12-2004",

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Circuit design to achieve whole-chip ESD protection for UXGA/HDTV LCos IC product. / Ker, Ming-Dou; Chen, Shih Hung; Tseng, Tang Kui.
2004. 845-848 Paper presented at 2004 IEEE Asia-Pacific Conference on Circuits and Systems, APCCAS 2004: SoC Design for Ubiquitous Information Technology, Tainan, Taiwan.

Research output: Contribution to conference › Paper › peer-review

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AU - Ker, Ming-Dou

AU - Chen, Shih Hung

AU - Tseng, Tang Kui

PY - 2004/12/1

Y1 - 2004/12/1

N2 - Successful circuit design to achieve the whole-chip electrostatic discharge (ESD) protection for an UXGA/HDTV LCoS IC product with a die size of 20289.6μm × 16841.5μm has been proposed and practically verified in 0.35-μm 3.3V/12V CMOS process. This LCoS IC with both of low-voltage (LV) and high-voltage (HV) ESD protection circuits can sustain ESD stresses of 3.5kV and 200V in human-body-model (HBM) and machine-model (MM) ESD test standards, respectively.

AB - Successful circuit design to achieve the whole-chip electrostatic discharge (ESD) protection for an UXGA/HDTV LCoS IC product with a die size of 20289.6μm × 16841.5μm has been proposed and practically verified in 0.35-μm 3.3V/12V CMOS process. This LCoS IC with both of low-voltage (LV) and high-voltage (HV) ESD protection circuits can sustain ESD stresses of 3.5kV and 200V in human-body-model (HBM) and machine-model (MM) ESD test standards, respectively.

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T2 - 2004 IEEE Asia-Pacific Conference on Circuits and Systems, APCCAS 2004: SoC Design for Ubiquitous Information Technology

Y2 - 6 December 2004 through 9 December 2004

ER -

Circuit design to achieve whole-chip ESD protection for UXGA/HDTV LCos IC product

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