Characterizations of deep levels in SnTe-doped GaSb by admittance spectroscopy

Jenn-Fang Chen*, N. C. Chen, H. S. Liu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

A dominant deep level with an activation energy of 0.23-0.26 eV was observed by admittance spectroscopy for SnTe-doped GaSb layers grown directly on GaAs substrates by molecular beam epitaxy (MBE). The activation energy and capture cross section of the deep level are similar to the levels detected in S-doped and Te-doped GaSb grown by MBE, indicating that this deep level originates either from a native defect or a common impurity in n-type GaSb, The Sb4/Ga flux ratio was found to affect the Hall mobility and concentration of the deep level in a similar way, with an optimal beam equivalent pressure ratio around 7 obtained for GaSb grown at 550 °C, which should correspond to the lowest ratio to maintain a Sb-stabilized surface reconstruction. Analysis of this result suggests that the deep level seen by us is a complex defect.

Original languageEnglish
Pages (from-to)1891-1893
Number of pages3
JournalApplied Physics Letters
Volume69
Issue number13
DOIs
StatePublished - 23 Sep 1996

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