Characterization of thin-film electroluminescent devices with multiple Ta₂O₅ interlayers incorporated into SrS:Pr,Ce phosphor

Engineering

• Thin Films 100%
• Interlayer 100%
• Phosphor Layer 100%
• Ce Phosphor 100%
• Device Structure 66%
• Interface State 33%
• Crystallinity 33%
• Intermediate Layer 33%
• Magnetron 33%
• Active Layer 33%
• Deposition Temperature 33%
• Charge Density 33%
• Internal Field 33%
• Thermal Cycle 33%
• Ray Measurement 33%
• Barrier Film 33%
• Tower 33%

Keyphrases

• Ta2O5 100%
• Electroluminescent Devices 100%
• Phosphor Layer 75%
• Device Structure 50%
• Measurement Results 25%
• Interface States 25%
• Active Layer 25%
• Threshold Voltage 25%
• Deposition Temperature 25%
• Chromaticity 25%
• Charge Density 25%
• Stacked Structure 25%
• Internal Field 25%
• RF Magnetron Sputtering 25%
• X-ray Measurements 25%
• Thin Barrier 25%
• Enhanced Crystallinity 25%
• Sawyer-Tower 25%
• Transferred Charge 25%
• Absorption Problems 25%
• Thermal Cycle Annealing 25%
• Multi-barrier 25%
• Window Effect 25%

Material Science

• Thin Films 100%
• Density 50%
• Film 50%
• Annealing 50%
• Electronic Circuit 50%
• Magnetron Sputtering 50%