Conductive-tip atomic force microscopy (C-AFM) is a powerful tool for investigating the electrical characteristics of phase-change materials commonly used for electronic and optical data storage. We demonstrate the usefulness of this technique by examining the electrical conductivity of crystalline marks recorded with a focused laser pulse on a thin Ge2Sb2Te5 film.
|Number of pages||6|
|Journal||Physica Status Solidi (B) Basic Research|
|State||Published - Oct 2012|
- Electronic data storage
- Materials and process characterization
- Optical recording
- Phase-change materials