Characteristic fluctuation dependence on discrete dopant for 16nm SOI FinFETs at different temperature

Yiming Li, Chih Hong Hwang, Shao Ming Yu, Hsuan Ming Huang, Ta Ching Yeh, Hui Wen Cheng, Hung Ming Chen, Jiunn Ren Hwang, Fu Liang Yang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

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Mathematics

Engineering & Materials Science