An approach is presented to characterize on-chip differential coplanar-strip-line (CPS) test circuits using G-S-G probes. With a symmetric duplicate of the test circuit in shunt connection, the circuit can be characterized over a wide frequency range. This method is especially effective to miniaturized circuits. A 40-GHz silicon-based filter is employed for demonstration.
|Number of pages||4|
|State||Published - 1 Dec 2004|
|Event||IEEE 13th Topical Meeting on Electrical Performance of Electronic Packaging - Portland, OR, United States|
Duration: 25 Oct 2004 → 27 Oct 2004
|Conference||IEEE 13th Topical Meeting on Electrical Performance of Electronic Packaging|
|Period||25/10/04 → 27/10/04|