Broadband characterization of miniaturized on-chip differential circuits using G-S-G probe

Hung Ta Tso*, Chien-Nan Kuo

*Corresponding author for this work

    Research output: Contribution to conferencePaperpeer-review

    Abstract

    An approach is presented to characterize on-chip differential coplanar-strip-line (CPS) test circuits using G-S-G probes. With a symmetric duplicate of the test circuit in shunt connection, the circuit can be characterized over a wide frequency range. This method is especially effective to miniaturized circuits. A 40-GHz silicon-based filter is employed for demonstration.

    Original languageEnglish
    Pages139-142
    Number of pages4
    DOIs
    StatePublished - 1 Dec 2004
    EventIEEE 13th Topical Meeting on Electrical Performance of Electronic Packaging - Portland, OR, United States
    Duration: 25 Oct 200427 Oct 2004

    Conference

    ConferenceIEEE 13th Topical Meeting on Electrical Performance of Electronic Packaging
    Country/TerritoryUnited States
    CityPortland, OR
    Period25/10/0427/10/04

    Fingerprint

    Dive into the research topics of 'Broadband characterization of miniaturized on-chip differential circuits using G-S-G probe'. Together they form a unique fingerprint.

    Cite this