Abstract
An approach is presented to characterize on-chip differential coplanar-strip-line (CPS) test circuits using G-S-G probes. With a symmetric duplicate of the test circuit in shunt connection, the circuit can be characterized over a wide frequency range. This method is especially effective to miniaturized circuits. A 40-GHz silicon-based filter is employed for demonstration.
Original language | English |
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Pages | 139-142 |
Number of pages | 4 |
DOIs | |
State | Published - 1 Dec 2004 |
Event | IEEE 13th Topical Meeting on Electrical Performance of Electronic Packaging - Portland, OR, United States Duration: 25 Oct 2004 → 27 Oct 2004 |
Conference
Conference | IEEE 13th Topical Meeting on Electrical Performance of Electronic Packaging |
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Country/Territory | United States |
City | Portland, OR |
Period | 25/10/04 → 27/10/04 |