Bipolar Transistors' Holding Phenomena

Shao Chang Huang*, Kai Chieh Hsu, Chih Hsuan Lin, Chien Wei Wang, Ching Ho Li*, Chih Cherng Liao, Jung Tsun Chuang, Gong Kai Lin, Lin Fan Chen, Chun Chih Chen, Yeh Ning Jou, Jian Hsing Lee, Ke Horng Chen*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Silicon Controlled Rectifier (SCR) is often applied for Electrostatic Discharge (ESD) protections. SCR holding voltage is requested to be larger than the integrated circuit (IC) operation voltage because SCR owns the latch-up phenomena. Bipolar transistors are more frequently than SCR to be used as ESD protections. Large holding voltages are also often requested for bipolar transistors. SCR owns the positive feedback circuit characteristics so it owns latch-up properties. However, bipolar transistors don't have the positive feedback circuit so the latch-up event should not occur. The latch-up characteristics in SCR and not in bipolar transistors are discovered well in this study through the silicon verifications.

Original languageEnglish
Title of host publication2023 International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2023 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages221-222
Number of pages2
ISBN (Electronic)9798350324174
DOIs
StatePublished - 2023
Event2023 International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2023 - Pingtung, Taiwan
Duration: 17 Jul 202319 Jul 2023

Publication series

Name2023 International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2023 - Proceedings

Conference

Conference2023 International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2023
Country/TerritoryTaiwan
CityPingtung
Period17/07/2319/07/23

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