Bayesian analysis for fault location in homogeneous distributed systems

Yu Lo Cyrus Chang*, Leslie C. Lander, Horng Shing Lu, Martin T. Wells

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

We propose a simple and practical probabilistic comparison-based model, employing multiple incomplete test concepts, for handling fault location in distributed systems using a Bayesian analysis procedure. This approach is more practical and complete than previous ones since it does not assume any conditions such as permanently faulty units, complete tests, perfect environments, or non-malicious environments. Fault-free systems are handled without overhead, hence the test procedure may be used to monitor a functioning system. Given a system S with a specific test graph, the corresponding conditional distribution between the comparison test results (syndrome) and the fault patterns of S can be generated. To avoid the complex global Bayesian estimation process, we develop a simple bitwise Bayesian (B-) algorithm for fault location in S, which locates system failures with linear complexity, suitable for hard real-time systems.

Original languageEnglish
Title of host publicationProc 12th Symp Reliab Distrib Syst
Editors Anon
PublisherPubl by IEEE
Pages44-52
Number of pages9
ISBN (Print)0818643129
DOIs
StatePublished - 1 Dec 1993
EventProceedings of the 12th Symposium on Reliable Distributed Systems - Princeton, NJ, USA
Duration: 6 Oct 19938 Oct 1993

Publication series

NameProc 12th Symp Reliab Distrib Syst

Conference

ConferenceProceedings of the 12th Symposium on Reliable Distributed Systems
CityPrinceton, NJ, USA
Period6/10/938/10/93

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