Automation of synchronous bias transmission line pulsing system

Bor Wei Chang; Hsin Chyh Hsu; Ming-Dou Ker

doi:10.1109/VDAT.2007.373254

Automation of synchronous bias transmission line pulsing system

Bor Wei Chang^*, Hsin Chyh Hsu, Ming-Dou Ker

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

Synchronous Bias Transmission Line Pulsing (SB-TLP) system is able to provide a synchronous bias voltage to transmission line Pulse. It's a more useful test bench to evaluate actual circuit characteristics of electrostatic discharge (ESD) protection design with gate-driven mechanism than traditional Transmission Line Pulsing (TLP) system. It's important to set up an automatic SB-TLP system and be able to immediately analyze measured data which is more convenient to engineers. All of the instruments are controlled by a software written in Lab VIEW environment to create a smart and friendly test workbench.

Original language	English
Title of host publication	2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers
DOIs	https://doi.org/10.1109/VDAT.2007.373254
State	Published - 28 Sep 2007
Event	2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Hsinchu, Taiwan Duration: 25 Apr 2007 → 27 Apr 2007

Publication series

Name	2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers

Conference

Conference	2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007
Country/Territory	Taiwan
City	Hsinchu
Period	25/04/07 → 27/04/07

Access to Document

10.1109/VDAT.2007.373254

Cite this

Chang, B. W., Hsu, H. C., & Ker, M-D. (2007). Automation of synchronous bias transmission line pulsing system. In 2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers [4239446] (2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers). https://doi.org/10.1109/VDAT.2007.373254

@inproceedings{1f72a2a72cc8456da02d1c60dcdb2d20,

title = "Automation of synchronous bias transmission line pulsing system",

abstract = "Synchronous Bias Transmission Line Pulsing (SB-TLP) system is able to provide a synchronous bias voltage to transmission line Pulse. It's a more useful test bench to evaluate actual circuit characteristics of electrostatic discharge (ESD) protection design with gate-driven mechanism than traditional Transmission Line Pulsing (TLP) system. It's important to set up an automatic SB-TLP system and be able to immediately analyze measured data which is more convenient to engineers. All of the instruments are controlled by a software written in Lab VIEW environment to create a smart and friendly test workbench.",

author = "Chang, {Bor Wei} and Hsu, {Hsin Chyh} and Ming-Dou Ker",

year = "2007",

month = sep,

day = "28",

doi = "10.1109/VDAT.2007.373254",

language = "English",

isbn = "1424405831",

series = "2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers",

booktitle = "2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers",

note = "2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 ; Conference date: 25-04-2007 Through 27-04-2007",

}

Chang, BW, Hsu, HC & Ker, M-D 2007, Automation of synchronous bias transmission line pulsing system. in 2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers., 4239446, 2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers, 2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007, Hsinchu, Taiwan, 25/04/07. https://doi.org/10.1109/VDAT.2007.373254

Automation of synchronous bias transmission line pulsing system. / Chang, Bor Wei; Hsu, Hsin Chyh; Ker, Ming-Dou.
2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers. 2007. 4239446 (2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Ker, Ming-Dou

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N2 - Synchronous Bias Transmission Line Pulsing (SB-TLP) system is able to provide a synchronous bias voltage to transmission line Pulse. It's a more useful test bench to evaluate actual circuit characteristics of electrostatic discharge (ESD) protection design with gate-driven mechanism than traditional Transmission Line Pulsing (TLP) system. It's important to set up an automatic SB-TLP system and be able to immediately analyze measured data which is more convenient to engineers. All of the instruments are controlled by a software written in Lab VIEW environment to create a smart and friendly test workbench.

AB - Synchronous Bias Transmission Line Pulsing (SB-TLP) system is able to provide a synchronous bias voltage to transmission line Pulse. It's a more useful test bench to evaluate actual circuit characteristics of electrostatic discharge (ESD) protection design with gate-driven mechanism than traditional Transmission Line Pulsing (TLP) system. It's important to set up an automatic SB-TLP system and be able to immediately analyze measured data which is more convenient to engineers. All of the instruments are controlled by a software written in Lab VIEW environment to create a smart and friendly test workbench.

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M3 - Conference contribution

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SN - 9781424405831

T3 - 2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers

BT - 2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers

T2 - 2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007

Y2 - 25 April 2007 through 27 April 2007

ER -

Chang BW, Hsu HC, Ker M-D. Automation of synchronous bias transmission line pulsing system. In 2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers. 2007. 4239446. (2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers). doi: 10.1109/VDAT.2007.373254

Automation of synchronous bias transmission line pulsing system

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