@inproceedings{55dd50ba50f945efb95f85ff8a30bbb4,
title = "Automatic Search Method of Robust Gate Driving Vectors for Digital Gate Drivers against Variations in Operating Conditions of IGBT's",
abstract = "To solve the trade-off between the switching loss and the current/voltage overshoot of power transistors, a digital gate driver is effective. A temperature and load current dependent optimization of the gate driving vectors (GV) for the digital gate drivers, however, is required [7]. Robust gate driving vectors (RGV) to the temperature and load current variations are proposed in [9]. The test cost to search RGV, however, is very high. To reduce the test cost, a robust simulated annealing (RSA) for an automatic search method of RGV is proposed. In the proposed RSA, instead of changing the operating conditions, GV is varied in a single operating condition. Compared with the conventional method to search RGV [9], the proposed RSA reduces the measurement time by more than 85 % (from more than 5.5 hours to less than 50 minutes), which results in the reduced test cost.",
keywords = "Gate driver, IGBT, Switching loss, Temperature",
author = "Wang, {Ting Wei} and Toru Sai and Ryuzo Morikawa and Katsuhiro Hata and Takayasu Sakurai and Po-Hung Chen and Makoto Takamiya",
note = "Publisher Copyright: {\textcopyright} 2020 IEEE.; null ; Conference date: 11-10-2020 Through 15-10-2020",
year = "2020",
month = oct,
day = "11",
doi = "10.1109/ECCE44975.2020.9236253",
language = "English",
series = "ECCE 2020 - IEEE Energy Conversion Congress and Exposition",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "3798--3802",
booktitle = "ECCE 2020 - IEEE Energy Conversion Congress and Exposition",
address = "United States",
}