TY - GEN
T1 - Automatic Defense through Fault Localization and Dynamic Patch Creation
AU - Chen, Hsia Hsiang
AU - Zheng, Da Qun
AU - Huang, Shih-Kun
PY - 2016/9/21
Y1 - 2016/9/21
N2 - The US Department of Defense has called for contest on automatic attack and defense. The contest is a competition, called Cyber Grand Challenge (CGC), aimed at developing cyber security systems. In accordance with the competition rules, we developed an automatic cyber reasoning system (CRS) that meets the objectives specified in the CGC. Our CRS combines the techniques of fuzz testing, fault localization, and binary patch creation to construct an automatic defense system. From the sample problems in the CGC, we evaluate our system and the binary patch capability by applying them to real programs. We explore two patching methods in five challenges in CGC with partial successes in availability and security.
AB - The US Department of Defense has called for contest on automatic attack and defense. The contest is a competition, called Cyber Grand Challenge (CGC), aimed at developing cyber security systems. In accordance with the competition rules, we developed an automatic cyber reasoning system (CRS) that meets the objectives specified in the CGC. Our CRS combines the techniques of fuzz testing, fault localization, and binary patch creation to construct an automatic defense system. From the sample problems in the CGC, we evaluate our system and the binary patch capability by applying them to real programs. We explore two patching methods in five challenges in CGC with partial successes in availability and security.
KW - Cyber Grand Challenge (CGC)
KW - binary patch
KW - cyber reasoning system (CRS)
KW - fault localization
KW - fuzz testing
UR - http://www.scopus.com/inward/record.url?scp=84991807860&partnerID=8YFLogxK
U2 - 10.1109/QRS-C.2016.65
DO - 10.1109/QRS-C.2016.65
M3 - Conference contribution
AN - SCOPUS:84991807860
T3 - Proceedings - 2016 IEEE International Conference on Software Quality, Reliability and Security-Companion, QRS-C 2016
SP - 408
EP - 409
BT - Proceedings - 2016 IEEE International Conference on Software Quality, Reliability and Security-Companion, QRS-C 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2nd IEEE International Conference on Software Quality, Reliability and Security-Companion, QRS-C 2016
Y2 - 1 August 2016 through 3 August 2016
ER -