@inproceedings{d13b7382313c441bb37e17f6c6ed8638,
title = "Auto defect detection of A-IGZO thin film transistor backplane on foldable medical array panel application",
abstract = "This article reported on the pixel flaw detection properties of amorphous In-Ga-Zn-O-based active thin film transistors on flexible medical panel substrate application, which is using the non-invasive optoelectronic transforming inspection technique. The experimental data exactly showed good flaw detection rate > 90% and stable uniformity < 5%. Currently, it is a popular method with electrical testing and detection with advantages of ultrahigh resolution and small-pixel-sized medical panel, and no contact damaged to the application of flexible medical panel substrates.",
keywords = "a-IGZO, detection, foldable medical array panel, thin film transistor",
author = "Hung, {Yu Min} and Wang, {Yao Chin} and Yang, {Yu Ching} and Lin, {Bor Shyh} and Lin, {Bor Shing}",
year = "2018",
month = jan,
day = "8",
doi = "10.1109/SAI.2017.8252282",
language = "English",
series = "Proceedings of Computing Conference 2017",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1423--1425",
booktitle = "Proceedings of Computing Conference 2017",
address = "美國",
note = "2017 SAI Computing Conference 2017 ; Conference date: 18-07-2017 Through 20-07-2017",
}