Atomic-Scale Structural and Chemical Characterization of Hexagonal Boron Nitride Layers Synthesized at the Wafer-Scale with Monolayer Thickness Control

Wei Hsiang Lin, Victor W. Brar, Deep Jariwala, Michelle C. Sherrott, Wei Shiuan Tseng, Chih I. Wu, Nai Chang Yeh, Harry A. Atwater*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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Engineering & Materials Science

Chemical Compounds