Asymmetric gate capacitance and high frequency characteristic fluctuations in 16 nm bulk MOSFETs due to random distribution of discrete dopants

Yi-Ming Li*, Chih Hong Hwang, Ta Ching Yeh

*Corresponding author for this work

Research output: Contribution to conference › Paper › peer-review

Fingerprint

Dive into the research topics of 'Asymmetric gate capacitance and high frequency characteristic fluctuations in 16 nm bulk MOSFETs due to random distribution of discrete dopants'. Together they form a unique fingerprint.

Keyphrases

Engineering