Artificial Neural Network-Based Modeling for Estimating the Effects of Various Random Fluctuations on DC/Analog/RF Characteristics of GAA Si Nanosheet FETs

Rajat Butola, Yiming Li*, Sekhar Reddy Kola, Chieh Yang Chen, Min Hui Chuang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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