Area-efficient CMOS output buffer with enhanced high ESD reliability for deep submicron CMOS ASIC

Ming-Dou Ker*, Kuo Feng Wang, Mei Chu Joe, Yuan Hua Chu, Tain Shun Wu

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

12 Scopus citations

Fingerprint

Dive into the research topics of 'Area-efficient CMOS output buffer with enhanced high ESD reliability for deep submicron CMOS ASIC'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science