Keyphrases
Classification Model
100%
Semiconductor Industry
100%
Wafer Defect Pattern
100%
Defect Classification
100%
Classification Performance
66%
Wafer
33%
Deep Learning Methods
33%
Recognition Accuracy
33%
Pattern Recognition
33%
Defect Data
33%
Classification Accuracy
33%
Accuracy Rate
33%
Feature Extraction Methods
33%
Defect Pattern
33%
Semiconductor Manufacturing Process
33%
Pattern Classification
33%
Selection Problem
33%
Data Transformation
33%
Defect Distribution
33%
Imbalance Problem
33%
Transformation Learning
33%
Imbalanced Distribution
33%
Ensemble Learning Techniques
33%
Individual Classifiers
33%
Data Ensemble
33%
Computer Science
Classification Performance
100%
Pattern Classification
100%
Classification Models
100%
Recognition Accuracy
50%
Classification Accuracy
50%
Data Transformation
50%
Learning Technique
50%
Ensemble Learning
50%
Primary Objective
50%
Individual Classifier
50%
Pattern Recognition
50%
Deep Learning Method
50%
Feature Extraction
50%
Engineering
Classification Performance
100%
Recognition Accuracy
50%
Pattern Recognition
50%
Feature Extraction
50%
Semiconductor Manufacturing
50%
Manufacturing Process
50%
Classification Accuracy
50%
Test Dataset
50%
Learning Technique
50%
Deep Learning Method
50%
Chemical Engineering
Deep Learning Method
100%