Anomalous latchup failure induced by on-chip ESD protection circuit in a high-voltage CMOS IC product

I. Cheng Lin, Chih Yao Huang, Chuan Jane Chao, Ming-Dou Ker*

*Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

    9 Scopus citations

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    Engineering

    Earth and Planetary Sciences