Analysis and Prevention on NC-ball induced ESD Damages in a 683-Pin BGA Packaged Chipset IC

Wen Yu Lo*, Ming-Dou Ker

*Corresponding author for this work

    Research output: Contribution to journalConference articlepeer-review

    1 Scopus citations

    Fingerprint

    Dive into the research topics of 'Analysis and Prevention on NC-ball induced ESD Damages in a 683-Pin BGA Packaged Chipset IC'. Together they form a unique fingerprint.

    Keyphrases

    Engineering

    Medicine and Dentistry

    Earth and Planetary Sciences