@inproceedings{f19fad2fb0054b0c8abea69fc6ecfd0d,
title = "Analysis and Modeling of Flicker Noise in Ferroelectric FinFETs",
abstract = "This paper presents an in-depth analysis of the flicker noise (1/f noise) in Field Effect Transistors (FETs) with ferroelectric gate stack. The analysis is valid for all ferroelectric FETs (FeFETs). We have also proposed an enhancement to industry standard flicker noise models to take ferroelectric thickness into account.",
keywords = "Compact Model, Ferroelectric-FinFETs, Flicker Noise",
author = "Abhishek Kumar and Girish Pahwa and Behera, {Amit Kumar} and Anand Bulusu and Shruti Mehrotra and Avirup Dasgupta",
note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 2022 IEEE International Conference on Emerging Electronics, ICEE 2022 ; Conference date: 11-12-2022 Through 14-12-2022",
year = "2022",
doi = "10.1109/ICEE56203.2022.10118175",
language = "English",
series = "2022 IEEE International Conference on Emerging Electronics, ICEE 2022",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2022 IEEE International Conference on Emerging Electronics, ICEE 2022",
address = "美國",
}