Analysis and Modeling of Flicker Noise in Ferroelectric FinFETs

Abhishek Kumar, Girish Pahwa, Amit Kumar Behera, Anand Bulusu, Shruti Mehrotra, Avirup Dasgupta

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

This paper presents an in-depth analysis of the flicker noise (1/f noise) in Field Effect Transistors (FETs) with ferroelectric gate stack. The analysis is valid for all ferroelectric FETs (FeFETs). We have also proposed an enhancement to industry standard flicker noise models to take ferroelectric thickness into account.

Original languageEnglish
Title of host publication2022 IEEE International Conference on Emerging Electronics, ICEE 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665491853
DOIs
StatePublished - 2022
Event2022 IEEE International Conference on Emerging Electronics, ICEE 2022 - Bangalore, India
Duration: 11 Dec 202214 Dec 2022

Publication series

Name2022 IEEE International Conference on Emerging Electronics, ICEE 2022

Conference

Conference2022 IEEE International Conference on Emerging Electronics, ICEE 2022
Country/TerritoryIndia
CityBangalore
Period11/12/2214/12/22

Keywords

  • Compact Model
  • Ferroelectric-FinFETs
  • Flicker Noise

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