An X-Ray Study of Domain Structure and Stress in Pd2Si Films at Pd-Si Interfaces

Haydn Chen*, G. E. White, S. R. Stock, P. S. Ho

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations
Original languageEnglish
Title of host publicationMaterials Research Society Symposia Proceedings
PublisherNorth-Holland Publ Co
Number of pages49
ISBN (Print)0444007741
StatePublished - 1 Dec 1982

Publication series

NameMaterials Research Society Symposia Proceedings
ISSN (Print)0272-9172

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