An Offset Readout Current Sensing Scheme for One-Resistor RRAM-Based Cross-Point Array

You Da Chen, Albert Chin*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

The uneven sneak-path currents in resistive random access memory (RRAM) severely constrain the array size. To overcome this issue, we propose an innovative readout scheme that can fully offset the sneak-path currents in one-resistor (1R) RRAM array. Furthermore, the bit cell resistance (Rcell) in an RRAM array can be simply evaluated as the ratio of read voltage (Vread) to the sensed offset current (Ioffset). Even under extreme device distribution, a 512× 512 array size is still obtained. This is the largest array among simple 1R RRAM, without using a selector device or extra transistor.

Original languageEnglish
Article number8574911
Pages (from-to)208-211
Number of pages4
JournalIeee Electron Device Letters
Volume40
Issue number2
DOIs
StatePublished - Feb 2019

Keywords

  • Nonvolatile
  • cross-point array
  • current sensing
  • resistive random access memory (RRAM)
  • sneak current

Fingerprint

Dive into the research topics of 'An Offset Readout Current Sensing Scheme for One-Resistor RRAM-Based Cross-Point Array'. Together they form a unique fingerprint.

Cite this