@inproceedings{78facd3c6023403aa70e23ecd08dc0bc,
title = "An Inaccuracy Thermal Sensor with a New Digital Calibration Algorithm in 12nm CMOS",
abstract = "This paper presents an inaccuracy thermal sensor with a new digital calibration algorithm in 12 nm CMOS process. The conventional temperature-to-digital converter calibration relies on the reproducibility of VBE, which slightly depends on the process variation and becomes a challenge in designing an accurate thermal sensor. This work develops a new digital calibration algorithm that treats environmental temperature as an absolute reference to overcome process variation. It calibrates the BJT |V_BE| error using |V_BE| differences between two devices. The thermal sensor consists of a bipolar core, a bandgap reference (BGR), and a 10-bit successive-approximation-register (SAR) analog-to-digital converter (ADC) is fabricated in 12nm CMOS process. Thanks to the proposed digital calibration algorithm, the measurement results demonstrate -2.09C~ 1.50C inaccuracy over a temperature range of 0C to 80C without any device trimming.",
keywords = "bandgap, calibration, CTAT, PTAT, temperature-to-digital converter, The base-emitter voltage (|V|)",
author = "Wu, {Jun Wan} and Chang, {Yu Sin} and Wang, {Ding Hao} and Chen, {Po Hung}",
note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 21st IEEE Interregional NEWCAS Conference, NEWCAS 2023 ; Conference date: 26-06-2023 Through 28-06-2023",
year = "2023",
doi = "10.1109/NEWCAS57931.2023.10198136",
language = "English",
series = "21st IEEE Interregional NEWCAS Conference, NEWCAS 2023 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "21st IEEE Interregional NEWCAS Conference, NEWCAS 2023 - Proceedings",
address = "美國",
}