@inproceedings{2c5488bc9aa741a29c65edf756eb87ca,
title = "An event-driven incremental timing fault simulator",
abstract = "An efficient MOS multiple sets of multiple faults simulator with electrical timing information is presented. By using event-driven, selective trace and mixed incremental-in-space, signal and time simulation techniques, the simulation results show that it is superior in speedup, extra memory used and precision to other approaches. Moreover, this simulator is suited for parallel simulation in a multiprocessor system.",
author = "Shyh-Jye Jou and Shen, {Wen Zen} and Chiou, {Shwu Huey}",
year = "1991",
month = jan,
day = "1",
doi = "10.1109/VTSA.1991.246754",
language = "English",
series = "International Symposium on VLSI Technology, Systems, and Applications, Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "424--427",
booktitle = "1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers, VTSA 1991",
address = "United States",
note = "1991 International Symposium on VLSI Technology, Systems, and Applications, VTSA 1991 ; Conference date: 22-05-1991 Through 24-05-1991",
}