An enhanced boundary scan architecture for inter-die interconnect leakage measurement in 2.5D and 3D packages

Pok Man Preston Law, Cheng Wen Wu, Long Yi Lin, Hao-Chiao Hong

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations


3D-IC is a solution to achieve lower cost and higher performance as the transistor density doubles every 18 months following Moore's law. In recent years, Integrated Fan-Out Wafer-Level Chip-Scale Packaging (InFO WLCSP) is one of the most promising packaging technologies for 3D-IC. In InFO WLCSP, there are some inter-die interconnects. We cannot access these interconnects directly. Therefore, it causes 1-2% test coverage loss. As a result, a built-in self-test (BIST) or other design-for-test (DFT) methodology is necessary to test these interconnects. It is easy to detect open defects and short defects leading to large leakage currents with conventional test methods. However, defects leading to small leakage currents are hard to detect, so we focus on these defects in this work. In this paper, we propose a scheme to measure the small leakage current of these inter-die interconnects. The scheme uses IEEE 1149.1 boundary scan interface. Because boundary scan is a well-adopted standard, the scheme can be integrated into any electronic product easily. Beside four mandatory terminals, we add a reference current input. Users can apply current to compare it with the leakage current. For the input EBSC, two OR gates, a MUX, and a current digitizer are added and it is compared with the conventional BSC. A test chip is implemented to verify our design, which uses the one-polynine-metal (1P9M) 90nm CMOS technology. Measurement results show that the proposed scheme is able to measure the leakage current of the interconnect. In addition, with the dynamic range of 128nA, the current digitizer has 6-bit resolution.

Original languageEnglish
Title of host publicationProceedings - 2017 IEEE 26th Asian Test Symposium, ATS 2017
PublisherIEEE Computer Society
Number of pages6
ISBN (Electronic)9781538624364
StatePublished - 24 Jan 2018
Event26th IEEE Asian Test Symposium, ATS 2017 - Taipei, Taiwan
Duration: 27 Nov 201730 Nov 2017

Publication series

NameProceedings of the Asian Test Symposium
ISSN (Print)1081-7735


Conference26th IEEE Asian Test Symposium, ATS 2017


  • 2.5D-IC
  • 3D-IC
  • Interconnect Test
  • Leakage


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